Of interest for indentation studies are the phases referred to as Si-II (β-tin structure, space group I41/amd) [50–52], Si-III or bc8 (body-centered cubic structure with 8 atoms per unit cell, space group Ia3¯) [52–54], Si-IV or hd (hexagonal diamond structure, space ...
Lattice constant, bulk modulus, Young modulus, valence band width, conduction band width, energy gap, vibrational energy, and plasmon energy have been calculated under compression and tensile stresses in the range (0 卤 10 GPa) for 8, 54, 128 atom clusters of silicon by means of density ...
modulus of elasticity (or Young's modulus)giga PascalGPa10-9m-1kg s-2 molar energyjoule per moleJ/molem-2kg s-2mol-1 molar entropy (or molar heat capacity)joule per mole KelvinJ/(mole K)m-2kg s-2K-1mol-1 moment of force (or torque)Newton meterN mm2kg s-2 ...
Specifically, we computed the total energy E(V) for different volumes V of the unit cell, considering three magnetic configurations: antiferromagnetic (AFM), ferromagnetic (FM), and non-magnetic (NM). For the quaternary Heusler alloys IrCoTiZ (Z = Si, Sn, Pb), three distinct structural...
anomalous quantum Hall effects19, diverse magnetic quantizations20,21,22,23, rich Coulomb excitations and decays24,25,26,27,28, different magneto-optical selection rules29,30,31, the exceedingly high mobility of charge carriers32,33, and the largest Young’s modulus of materials ever tested34....
Young's Modulus G•Pa 88.3 136 69 - 100.5 121 169.9 Shear Modulus G•Pa 29.6 - 26.0 - 31.3 - -Physical Properties By Wire Type Item Unit Gold4N-AuGFC Type SilverAlloySEC Type Bare Copper4N CuCFB-1 Type Coated Copper4N PCCCLR-1ATCHR Type AlumimumAl-Si1%TABN Type Test Method Hard...
2 corresponds to the elastic region of deformation. However, due to the influence of compliance of parts other than the tested specimen, the slope in the linear region does not correspond to the Young’s modulus. The curves deviate from linearity at stresses in the range 120–140 MPa, which...
UNIT测试方法 TEST METHOD Young's Modulus Young's ModulusMPa 固化时间(23℃,3.00 mm) Curing timehr 挤出速率 Extrusion rateg/min 热性能 THERMALDevcon Silite RTV®Techsil® IS803单位 UNIT测试方法 TEST METHOD Tack Free Time(23℃) Tack Free Time(23℃)min ...
A sin2Ψ plot (Supplementary Fig. S1) shows that the TiN film is essentially stress-free in as-deposited condition with a tensile stress of only 0.03% of the Young's modulus E. After annealing the Cu/TiN bilayer at 700 °C, additional diffraction peaks appear at 2θ = 28.0,...
LEFM utilizes also the effective elastic constant describing pure tension, Young modulus. Considering simple tension of a perfect crystal (i.e. Fig. 1 without the crack) in the L direction [1¯10] in Fig. 1, Young modulus under plane stress condition in the B-direction [1 1 0] ...