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In a semiconductor memory device including resistance change memory devices, when a resistance change memory device is in standby mode, the two terminals of the resistance change memory device, i.e., a bit line and a source line, are set at a precharge potential Vp by a bit-line pre...
In a semiconductor memory device including resistance change memory devices, when a resistance change memory device is in standby mode, the two terminals of the resistance change memory device, i.e., a bit line and a source line, are set at a precharge potential Vp by a bit-line precharge...
The semiconductor memory circuit 10, 30 in which errors occurred is indicated by the result of odd- even check 106, 112 and the bit to be corrected is detected. Corrected, error- free normal information 102-1-102-n and 110 is outputted to outside from error correcting circuits 24, 32....
These signals are selectively input to main decoders consisting of NAND circuits. Further, these signals are fed via through programming fuse elements to a NOR gate. The fuse elements and the NOR gate form a programmable spare decoder. When the bit selected by the main decoder is defective, ...
In a semiconductor memory device having a spare memory cell array and a spare column decoder and a spare row decoder as redundant circuits, redundancy detecting circuits for testing to see whether the redundant circuits are used or not after completion of the semiconductor memory device as a produ...
A semiconductor memory device includes: a plurality of memory cells arranged in a matrix; a memory cell array divided into a plurality of blocks; a plurality of read amplifiers, each of which is coupled correspondingly to each of the blocks; and a plurality of latch circuits, each group of ...
A test circuit of a semiconductor memory device for performing a test in cooperation with a tester having a plurality of input/output pins connected to a plurality of input/output lines. The test circuit may include a first comparing unit adapted to compare, on a bit-by-bit basis, read dat...
Semiconductor memory device having mount test circuits and mount test method thereof A semiconductor memory device having a mount test circuit and a mount test method thereof are provided. The test circuit for use in a semiconductor memory ... K Betteridge,DA Haynes,JR Sedcole - US 被引量: ...
Semiconductor integrated circuit device, data processing system and memory system The data for being processed are transmitted by utilizing a daisy chain constitution using a plurality of semiconductor integrated circuit devices each having an input terminal for receiving an input signal containing any one...