Used JEOL SEM JSM-6360LV $15,000.00 USD Used FEI xl30 FEG SEM electron microscope with EDS and BSE $65,000.00 USD Used FEI Dualbeam FIB 200mm Altura with TEM sample lift-out $235,000.00 USD Refurbished Win11 JEOL 6400 Refurbished SEM - Powered by SEMView8000 Please Inquire Refurbishe...
SUBJECT: Polymeric microparticles with Au-Pd sputtering; CREDIT: Maria de los Angeles Ramirez, CIC biomaGUNE, San Sebastian, España - Instituto de Nanosistemas, San Martín, Argentina; METHOD/INSTRUMENT: SEM JEOL JSM-6490LV Ant head SUBJECT: Ant head; CREDIT: Flavio Guerra Loureiro; METHOD/INS...
See the JEOL USA SEM/TEM/EPMA Image Contest Grand Prize Winners for 2023. Take a look at the winning entries by clicking here.