2013-05-23 12:21 求翻译:ning electron microscope (SEM, Hitachi, Tokyo, Japan) S-4700 and an atomic force microscope (AFM, PSIA Co.,是什么意思?待解决 悬赏分:1 - 离问题结束还有 ning electron microscope (SEM, Hitachi, Tokyo, Japan) S-4700 and an atomic force microscope (AFM, PSIA Co...
at 10 mA for 1 min and observed under a Hitachi S-4100 field emission scanning electron microscope (Hitachi, Tokyo, Japan) at an accelerating voltage of 5-10 kV and a working distance of 15 mm.J. PerdigaoP. LambrechtsB. Van Meerbeek...
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12083 JAPAN UNIX SOLDERING CONTOLLER, 200VAC, 400W, P/N: N2200 USC-881 12087 SIEMENS SIMATIC S7 ANALOG INPUT MODULE 6ES7 331-1KF02-0AB0 12096 MYCOM 5-PHASE STEP DRIVER UNIT, AC200-220V IMS51-120 121 LUXTRON OPTICAL FIBER TEMPERATURE CONTROL SYSTEM M110C ...
申请人名称株式会社日立高新技术(KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES(D/B/A HITACHI HIGH-TECHNOLOGIES CORPORATION)) 申请人地址日本国东京都港区西新桥一丁目2***(1-24-14 NISHI SHIMBASHI,MINATO-KU,TOKYO,JAPAN) 流程信息 2012-10-08商标注册申请-打印受理通知 ...
SPIE-The International Society for Optical EngineeringSPIE v. pt.Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-koigakubo, Kokubunji-shi, Tokyo 185-8601, JapanMetrology, inspection, and process control for microlithography XVIII, part 1: Conference on metrology, inspection, and process ...
Central Research Laboratory Hitachi Ltd. Higashi-koigakubo Kokubunji-shi Tokyo 185-8601 JapanMetrology, Inspection, and Process Control for Microlithography XXII pt.2Atsuko Yamaguchi and Jiro Yamamoto, "Influence of Image Processing on Line-Edge Roughness in CD-SEM Mesurement", SPIE Vol. 6922, ...
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