SHIFT-REGISTER AND SCAN-REGISTERPROBLEM TO BE SOLVED: To obtain a shift-register and a scan-register, by which excess stress is not applied to a switch-transistor, by applying bias while exceeding one clock period for a vertical interval period.RUKIYA ISUMATSUTO ARA HAKU...
The article reports on the results of a Credit Union National Association (CUNA) survey on key trends and challenges facing credit unions. CUNA reported that its 2008 Credit Union Environmental Scan, which it recommends for strategic planning sessions, budgeting, product development and the like is...
PROBLEM TO BE SOLVED: To reduce instantaneous voltage droop (IVD) during a scan shift operation.NARENDRA DEVTA-PRASANNAナレンドラデヴタ-プラサンナSUNDEEP KUMAR GAULサンディープクマーゴールARUN K GUNDAアルンケイグンダ
Sinanoglu, "Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test," IEEE Trans Computer-Aided Design of Integrated Circuits and Systems, 28(2), 2009, pp. 298-302.S. Almukhaizim and O. Sinanoglu, "Dynamic scan chain partitioning for reducing peak shift power during test...
Chu. Scan- chain partition for high test-data compressibility and low shift power under routing constraint. IEEE Trans. on CAD of Integrated Circuits and Systems, 28(5):716-727, 2009.W.S. Jyan, K. Shumin, C. Shihcheng, S. Huaiyan, C. Yunlung, "Scan-chain partition for high test-...
PROBLEM TO BE SOLVED: To reduce instantaneous voltage droop (IVD) during a scan shift operation.NARENDRA DEVTA-PRASANNAナレンドラデヴタ-プラサンナSUNDEEP KUMAR GAULサンディープクマーゴールARUN K GUNDAアルンケイグンダ
SHIFT REGISTER, SCAN DRIVING CIRCUIT AND DISPLAY APPARATUS HAVING THE SAMEPROBLEM TO BE SOLVED: To disclose a shift register, a scan driving circuit and a display apparatus having the same.BUN SHOKAN文 勝 煥
The shift register section which consecutively outputs the Drive mannered null scan signalPROBLEM TO BE SOLVED: To provide a gate drive circuit capable of preventing excessive generation of a kickback voltage even when raising voltage level of an output gate signal, and to provide a method of ...
The test response signals are mapped to a subset of the scan cells associated with the physical shift failures. Fault simulation is performed for the mapped subset of the scan cells to identify physical faults located within the integrated circuit causing the physical shift failures.Subhadip Kundu...
bidirectional operation control can be easily performed, a shift register of which bidirectional operation control and bidirectional scan control can be easily performed, and which is suitable for a display device driving circuit for a small and thin device, and a scan driving circuit for a display...