needs. We offer a range of versatile tools — everything from our easy-to-use desktop instruments such as theThermo Scientific Phenom Desktop Scanning Electron Microscopeto powerhouse instruments capable of unparalleled resolution and contrast like theThermo Scientific Verios Scanning Electron Microscope. ...
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Time on the microscope is precious, and excessive time spent on maintenance, alignments, training, or image optimization needs to be avoided. Apreo 2 Scanning Electron Microscope The new Thermo Scientific Apreo 2 SEM expands access to high-performance imaging and analytics to all levels o...
which the output signal of an inversion circuit for the output signal of a differentiation circuit for the scanning signal and the output signal of the differentiation circuit are added together, to make an electron beam irradiation point and an analysis point in scanning coincide with each other....
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Scanning Electron Microscope FlexSEM 1000 II FlexSEM 1000 II employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional...
Scanning Electron Microscope Drawtube N/A Other attributes Place of Origin Beijing, China Type Scanning Electron Microscope Customized support OEM, ODM Brand Name OPTO-EDU Model Number A63.7069 Material Metal Dimension / Magnification 300000x Accelerating Voltage 0~30KV Screen Magnification 8x~300000x ...
Field-Emission Environmental Scanning Electron Microscope 型号:美国FEI Quattro S 功能:用于材料表面、断面形貌观察,微区成分定性定量分析。 技术参数: ﹡分辨率:1.0nm(30KV, SE) ﹡附件:X射线能谱仪(EDS)、电子背散射衍射仪(EBSD) ﹡放大倍数:300万倍 Model: FEI Quattro S Function: Used for observation of...
JSM-IT200 InTouchScope™ Scanning Electron Microscope JCM-7000NeoScope™ Benchtop SEM SEM Options SM-92100EUVC EXCIMER UV CLEANER JED-2300 Analysis Station Plus Gather-X JED Series DrySD™ Windowless EDS Soft X-ray EmissionSpectrometer(SXES) ...
The Scanning Electron Microscope (SEM) uses optoelectronic system to focus electrons generated by an electronic gun onto a small spot on the sample surface. This beam of electrons will then interact with the sample material to generate secondary electrons, back scatter and signature X-Ray etc. A...