1.1 透射电子显微镜概论(Introduction to transmission electron microscopy TEM) 透射电子显微学 1748 0 53:36 App 扫描透射显微镜 IDPC成像技术在材料领域中的应用(杨光老师主讲) 1272 1 10:01 App 如何充分学习电子显微镜~How to get the most out of electron microscope training (双语翻译) 6218 0 05:03...
扫描电子显微镜(ScanningElectronMicroscope)基础知识 一、扫描电子显微镜的工作原理 扫描电镜是用聚焦电子束在试样表面逐点扫描成像。试样为块状或粉末颗粒,成像信号可以是二次电子、背散射电子或吸收电子。其中二次电子是最主要的成像信号。由电子枪发射的能量为5～35keV的电子,以其交叉斑作为电子源,经二级聚光镜及物镜...
The electron beam travels through the electron column, which consists of a set of lenses that focus the beam onto the sample surface. Electron microscope lenses can be electrostatic or magnetic, depending on whether they use an electrostatic field or a magnetic field to focus the electron beam...
needs. We offer a range of versatile tools — everything from our easy-to-use desktop instruments such as theThermo Scientific Phenom Desktop Scanning Electron Microscopeto powerhouse instruments capable of unparalleled resolution and contrast like theThermo Scientific Verios Scanning Electron Microscope. ...
DIY Scanning Electron Microscope自制电子显微镜SpaceInfinite 立即播放 打开App,流畅又高清100+个相关视频 更多1495 3 27:09 App 俄乌冲突暴露的短板,没有电磁压制,电子对抗有多重要? 10万 -- 2:27 App 机器人来到地上世界 4万 13 21:48 App 听风的蚕胆子越来越肥了敢讲这个内容不怕引火烧身吗? 183 ...
The Scanning Electron Microscope (SEM) uses optoelectronic system to focus electrons generated by an electronic gun onto a small spot on the sample surface. This beam of electrons will then interact with the sample material to generate secondary electrons, back scatter and signature X-Ray etc. A...
Scanning Electron Microscope FlexSEM 1000 II FlexSEM 1000 II employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional...
电子显微镜(SEM,电镜)ScanningElectronMicroscope “扫描电子显微镜”定义：Scanningelectronmicroscope（SEM）。定义1：用电子枪（一次电子）对样品表面扫描使其成像的电子显微镜。定义2：应用电子束在样品表面扫描激发出二次电子成像的电子显微镜。主要用于研究样品表面的形貌与成分。所属学科：光学仪器（二级学科）；电子光学...
1 Description The JSM-6610LV is a scanning electron microscope (SEM) comprised of a tungsten electron column and an Oxford Instruments Inca X-Act EDS. It can image and analyze a wide range of conducting and non-conducting samples, as well as provide compositional information using the EDS. 2...
Scanning electron microscope for versatile materials imaging and analysis. Apreo SEM is suited for the analysis of nanoparticles, catalyst, powders and nanodevices.