0x00 锁存器(Latch) 当输入信号被输入到异步时序逻辑电路中时,状态立即发生变化。 存在可以控制输入时机的控制信号,这个信号存在于称为门锁存器(Gate latch)的元件中。 输入信号通常被用作时钟信号,当时钟脉冲为 时,输入信号被反映。与触发器边沿动作的方式不同。 0x01 RS 触发器(RS Flip-Flop) RS触发器是由...
The limits have been tested up ±4 kV electrostatic discharge (HBM) and ± 8 kV contact discharge and ± 16 kV air discharge shocks without latch-up. Another external protections can be used to increase the communication robustness against different perturbation that can be seen on the ...
A flip-flop in digital electronics is a circuit with two stable states that can be used to store binary data. The stored data can be changed by applying varying inputs. Flip-flops and latches are fundamental building blocks of digital electronics systems used in computers, communications, and ...
4 × 0.1µF or 4 × 1µF • Latch-up performance exceeds 100mA per JESD 78, class II 2 Applications • Battery-powered systems • Notebooks • Laptops • Set-Top Boxes • Hand-held equipment 3 Description The TRS202E consists of two line drivers, two line receivers, and...
Control logic CS_n Address/command decoder Bank n Column decoder Column address buffer and burst counter Data control circuit Latch circuit Input and Output buffer DQ 27 DQS_t, DQS_c DM ODT 178-Ball, Single-Channel Mobile LPDDR3 SDRAM Simplified Bus Interface State Diagram Simplified Bus ...
RS485 RS232接口芯片介绍及选型指南 High Performance Analog Solutions for Digital World
The improved ESD tolerance is at least +15kV without damage nor latch-up. There are different methods of ESD testing applied: a) MIL-STD-883, Method 3015.7 b) IEC1000-4-2 Air-Discharge c) IEC1000-4-2 Direct Contact The Human Body Model has been the generally accepted ESD testing ...
Destructive latch-up can be induced due to the high energy content of the transients. Note that this stress is applied while the interface products are powered up and transmitting data. The EFT test applies hun- • Degradation or loss of function that is not recoverable due to damage. The...
Destructive latch-up can be induced due to the high energy content of the transients. Note that this stress is applied while the interface products are powered up and transmitting data. The EFT test applies hun- dreds of pulses with higher energy than ESD. Worst-case transient current on an...
An epitaxial layer • Low distortion prevents latchup. Each switch conducts equally well in both • Reduced power consumption directions when on. When off, they block voltages up to the • Improved reliability • Break-before-make switching action power-supply levels. APPLICATIONS • Audio...