Testing hot carrier induced degradation to fall and rise time of CMOS inverter circuitsPerformance degradation resulting from hot carrier stress is determined using a special test circuit. The test circuit is formed using a string of inverters on an integrated circuit. The string of inverters is ...
An electronic device is provided such as a programmable rise/fall time control circuit, for example, that delivers a continuous and near linear rising/falling slope of a control signal, with programmability that can be implemented in future CMOS image sensor devices. This device includes a programm...
even if noise enters the signal when the input transitions from Low to High, it will not become High unless the voltage of VPis exceeded. In addition, once it becomes High, it will remain High even if the voltage drops slightly,
A CMOS output driver having precise control of rise and fall times of signals generated from the output driver on a VLSI semiconductor chip. Two time-dependent voltage generators provide a separate ramp signal to each one of the gates of a CMOS inverter circuit. The ramp signal characteristics ...
A CMOS output driver having precise control of rise and fall times of signals generated from the output driver on a VLSI semiconductor chip. Two time-dependent voltage generators provide a separate ramp signal to each one of the gates of a CMOS inverter circuit. The ramp signal characteristics ...
A CMOS output driver having precise control of rise and fall times of signals generated from the output driver on a VLSI semiconductor chip. Two time-dependent voltage generators provide a separate ramp signal to each one of the gates of a CMOS inverter circuit. The ramp signal characteristics ...
Additionally the programmability block includes two outputs; a fall time control signal, and a rise time control signal. The device further includes a reset or transfer gate buffer configured as an inverter. The reset or transfer gate buffer includes three input signals: The fall time control ...