Secondary electron emission serves as the foundation for a broad range of vacuum electronic devices and instrumentation, from particle detectors and multip... JE Yater - 《Journal of Applied Physics》 被引量: 0发表: 2023年 Industrial-Scale PECVD Processing of Encapsulation Layers for Temperature- an...
Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices.关键词: Nanotubes Metallization contacts interconnects device isolation Nanotube devices DOI: 10.1063/1.1396632 被引量: 1320 ...
Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices.doi:10.1063/1.1396632Wei, B. Q.Vajtai, R.Ajayan, P. M.American Institute of PhysicsApplied Physics Letters
future nanoelectronic technologies, and these must be better understood at all stages of the integration process. The joint laboratory’s research will range from the most fundamental aspects of phenomena at the atomic level to systems, materials, the physics of devices and the design of robust ...
Multiple write techniques to improve reliability of 40nm TaOx-based resistive random access memory (ReRAM) are presented. A direct reliability trade-off ex... S Fukuyama,A Hayakawa,R Yasuhara,... - International Reliability Physics Symposium 被引量: 0发表: 2019年 ...
Research on micro/nano-electro-mechanical system (MEMS/NEMS) reliability is of crucial importance, due to the fact that we are facing an era in which MEMS and emerging NEMS are expected to have a major impact on our lives. Over the last decade, significant efforts have gone into the reliab...
Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices.B. Q. WeiDepartment of Materials Science and EngineeringR. VajtaiP. M. AjayanApplied physics lettersWei B Q,Vajtai R,jayan P M A.Reliability and current carrying ...
Probabilistic transfer matrix (PTM) is a widely used model in the reliability research of circuits. However, PTM model cannot reflect the impact of input signals on reliability, so it does not completely conform to the mechanism of the novel field-coupled nanoelectronic device which is called ...
aspects of phenomena at the atomic level to systems, materials, the physics of devices and the design of robust circuits.Its work will be conducted in a globally competitive environment and will focus on the most advanced microelectronic technologies, such as the 28-nanometer technology node and ...
aspects of phenomena at the atomic level to systems, materials, the physics of devices and the design of robust circuits.Its work will be conducted in a globally competitive environment and will focus on the most advanced microelectronic technologies, such as the 28-nanometer technology node and ...