The dependence of the refractive index of Si-dopedn-InGaAs on carrier density was investigated. The shift in the refractive index from that of undoped InGaAs was found to be mainly caused by the band-filling effect, the band-gap shrinkage effect, and the plasma effect. Model calculations agree...
The refractive index of silicon at 纬 -ray energies from 181 to 1959 keV was investigated using the GAMS6 double crystal spectrometer and found to follow the predictions of the classical scattering model. This is in contrast to earlier measurements on the GAMS5 spectrometer, which suggested a ...
For a typical sample of Si3N4 therefractive indexandextinction coefficientat632.8 nmare 2.02252 and 0. Below are files of complete refractive index and extinction coefficients. If the file is not available for download, you can request our proprietary file by clicking "Request". ...
Infrared laser interferometry was used to measure the temperature dependence, β(T), of the refractive index of Si, GaAs, and InP at λ=1.15, 1.31, 1.53, a... JA Mccaulley,VM Donnelly,M Vernon,... - 《Physical Review B Condensed Matter》 被引量: 140发表: 1994年 Infrared refractive ...
With the use of our extensiverefractive indexdatabase, the PVC thickness was easily measured. filmetrics.com filmetrics.com 利用我们庞大的折射率数据库,PVC厚度很容易测得。 cn.filmetrics.com cn.filmetrics.com [...]other dielectrics because the film’s Si:N ratio is rarely exactly 3:4, and thu...
of glasses A7850E Impurity and defect absorption in insulators A7830L Infrared and Raman spectra in disordered solids A6170W Impurity concentration, distribution, and gradients/ SiO2:OH/ss SiO2/ss O2/ss OH/ss Si/ss H/ss O/ss SiO2/bin O2/bin OH/bin Si/bin H/bin O/bin OH/dop H/dop...
中文:阶跃折射率光纤;英文:step-index optical fiber / SI optical fiber 中文:四分之一波长光学厚度;英文:quarter-wave optical thickness / QWOT 中文:增透膜;英文:antireflection coating / antireflection thin film 中文:增反膜;英文:high reflection coating / high reflection thin film ...
To investigate the sputtering process parameters silicon nitride was deposited on polished slices of Si. Multiple angle incidence ellipsometry was applied for the determination of the refractive index and thickness of the deposited layers. We found that the sputtered silicon oxynitride layers have ...
折射率(Refractiveindex)折射率(Refractive index)[RS0 rendering for high effect circular noise, S1 noise polygon][any object will absorb part of the light so as not to set the reflection as RGB 255 (Chun Bai). In this way, Maxwell loses contrast when rendering,And generate noise. Because...
We introduce the refractiveindex.info database, a comprehensive open-source repository containing optical constants for a wide array of materials, and describe in detail the underlying dataset. This collection, derived from a meticulous compilation of data sourced from peer-reviewed publications, manufact...