The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most atomic force microscopes use micromachined force sensors made from silicon, but piezoelectric quartz sensors are being applied at an increasing rate, mainly in vacuum. These self-sensing force sensors allow...
A high-Q AFM sensor using a balanced trolling quartz tuning fork in the liquid Sensors, 18 (5) (2018), p. 1628 CrossrefGoogle Scholar [47] C. Fang, T.T. Liang, S.D. Qiao, Y. He, Z.C. Shen, Y.F. Ma Quartz-enhanced photoacoustic spectroscopy sensing based on novel quartz tunin...
The mentioned high Q factors have lead QTF sensors to be widely used in Atomic Force Microscopes (AFM) by enabling measurements at angstrom levels [4]. To add, in several studies QTF transducers have been implemented to gas viscosity sensors which state that QTFs enable high precision viscosity...
Atomic force microscope (AFM)The atomic force microscope (AFM), developed later after scanning probe microscopes (SPM) and scanning tunneling microscopes (... BZ Cui,A Jaycox 被引量: 0发表: 0年 Wafer-Level Fabrication of a Fused-Quartz Double-Ended Tuning Fork Resonator Oscillator Using Quartz...
A quartz tuning fork as a force sensor for atomic force microscopy We are using a quartz tuning fork as the force sensor. The z-axis displacement of a conducting AFM tip due to surface features will be detected by observing the shift in resonance frequency of the tuning fork which is attac...
This paper reports the first demonstration of hydrogel atomic force microscope (AFM) tip attachment to quartz tuning forks (QTFs) by using elastomeric tip molds replicated from an electrochemically etched tungsten wire. The tungsten tip of ~20 nm radius obtained by time-controlled electrochemical ...
Simultaneous detection of vertical and lateral forces by bimodal AFM utilizing a quartz tuning fork sensor with a long tip Simultaneous detection of vertical and lateral forces at the nanoscale by atomic force microscopy (AFM) yields important knowledge on nanotribology. Although silicon (Si) cantileve...
Evaporation to exact resonance frequency was manually carried out one at a time on the semifinished and unsealed surface mount device quartz tuning fork cr... Lee,Sungkyu - 《Vacuum》 被引量: 3发表: 2002年 The quality factor of quartz DETF for resonant sensors: simulation, analysis and veri...
Tapping-mode atomic force microscopy (AFM) with a quartz tuning fork (QTF) is presented. The QTF is used as a force sensor to detect the interaction between the AFM probe tip and the sample surface. The first part of the chapter presents a tungsten probe QTF-AFM, in which a tungsten ...
Atomic force microscopy (AFM)Hydrogel tipShear forceTip attachmentQuartz tuning fork (QTF)This paper reports the first demonstration of hydrogel conical tip attachment onto quartz tuning fork (QTF) by using an elastomeric tip mold that is soft-lithographically replicated from an......