3O.3p.tOiRmpeitcziomavtiizeoarntyiooonffSoMef nSAseonMrso-SDruS1ru2farEfc2aecaeRnRetgeibegneonedreyraatftiriooonnm sensor surface using different regeneration solutions isRperceoRsvecneortevydeoriyfnMoFfiAgMuMAre-MD4-1.D2ME1A22EMa2n-aDtnib1ti2obEdo2ydayfnrfotrimobmosdesynenbsoisnordrsisunugr...
Characterization of MIP and NIP nanofilms on the QCM chip surface was achieved by atomic force microscopy (AFM), ellipsometry, Fourier transform infrared spectrophotometry-attenuated total reflectance (FTIR-ATR) and contact angle measurements (CA). The observations indicated that the nanofilm was almost...