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Samples were analyzed through transmittance electronic microscopy (TEM) using JEOL (Akishima, Tokyo, Japan) JEM-ARM200F equipment with a cold field emission gun operating at 200 kV. Powdered samples were directly dry-sprayed onto a commercially amorphous holey film carbon-coated copper grid. ...
2.5. Transmission Electronic Microscopy (TEM) The morphology of the electrospun fibers and the active multilayer films was studied using a Jeol 1010 (Hitachi, Tokyo, Japan), transmission electronic microscope an accelerating voltage of 80 kV. Samples were previously ultra-microtomed (Leica EM UC6,...
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2.2.6. Scanning Electron Microscopy (SEM) Scanning electron micrographs were taken from fracture surfaces with a Jeol JSM-6380LA (Tokyo, Japan) SEM with an acceleration voltage of 10 kV. Prior to the test, the samples were sputter-coated with a gold/palladium alloy. Appl. Sci. 2018, 8, ...
(8) ER (%) = (HHV of biocrude × mass biocrude) × 100 (HHV of microalgae × mass of dry microalgae) (9) The total organic content (TOC) of the aqueous phase was determined in Shimadzu-V equipment (Shimadzu Corp, Kyoto, Japan), and the pH was measured with a Basic 30 pH ...
Derived from Ce1´xCoxO2´y Precursors Yanyong Liu *, Kazuhisa Murata and Megumu Inaba Research Institute of Energy Frontier, National Institute of Advanced Industrial Science and Technology, AIST, Tsukuba West, Onogawa 16-1, Tsukuba, Ibaraki 305-8569, Japan; kazu-murata@aist.go.jp (K.M...
pus (Tokyo, Japan). A 5L64‐NW1 5 MHz phased array pulse echo transducer from TTooO lddyemefifpinnuees t (htTheoekd dyaoam,m Jaagapgeaena )ra ewraei,tahC, a-CS S‐cZSac1na‐s0nLws‐ IewHreCerc5eaL...
The results of X-ray fluorescence analysis (XRF, Primus2, Rigaku, Japan) of the limestone and CFA specTimheenressaurletsshoof wX-nrainy Tflaubolree1s.ceTnhceelaimnaelsytsoinse(XcoRnFt,aPinrsim52u.s92%, RoifgCakauO,,Jwaphainch) ocof rtrheespliomnedsstotnoe94a.n6d% CwFhAenspcoec...
The chemical compositions of the floor tile formulations were determined by using an energy-dispersive X-ray spectrometer (Shimadzu, Japan, EDX 700). X-ray diffraction analysis was done in a conventional powder diffractometer (Shimadzu, Japan, XRD 7000) by using monochromatic Cu-Kα radiation (λ...