MN, USA) Proc. SPIE — Int. Soc. Opt. Eng. (USA), vol. 923, pp. 194–200 (1988). (Electron-Beam, X-Ray, and Ion-Beam Technology 下载积分: 600 内容提示: FET VLSI circuits arc considered. Power dissipation sets an upper complexity limit for a given logic circuit implemen/ation ...
SPIE-Int. Soc. Opt. Eng., 1997, 3056, 20–32 Recent developments of wafer-fused long-wavelength VECSELs resulted in reaching record high CW output power of 6.6 W at 1300 nm and a coherence length long... None 被引量: 0发表: 1998年 Earth Surface Remote Sensing. Proc. SPIE conference...