probe testingSINGBARTL GUENTHER
WAFER PROBE TESTING Planarity High performance function test wafer probe requires a solution that overcomes issues of interconnects and extended signal path lengths. For highest performance into the giga- hertz region, membrane probes have proven to provide the best environ- ment for controlling impedanc...
PC board probing PC主板的电性测试 ESD&TDR testing ESD和TDR测试 Microwave probing 微波量测(高频) Solar太阳能领域检测分析 LED、OLED、LCD领域检测分析 二:手动探针台的使用方式: 1.将样品载入真空卡盘,开启真空阀门控制开关,使样品安全且牢固地吸附在卡盘上。 2.使用卡盘X轴/Y轴控制旋钮移动卡盘平台,在显微...
PC board probing PC主板的电性测试 ESD&TDR testing ESD和TDR测试 Microwave probing 微波量测(高频) Solar太阳能领域检测分析 LED、OLED、LCD领域检测分析 二:手动探针台的使用方式: 1.将样品载入真空卡盘,开启真空阀门控制开关,使样品安全且牢固地吸附在卡盘上。 2.使用卡盘X轴/Y轴控制旋钮移动卡盘平台,在显微...
semiconductor manufacturing and semiconductor testing or relevant experience in NAND product functional test program development is a plus. Advanced understanding of NAND test equipment and interface hardware. Advanced Perl programming skills- Intermediate Python programming skills ...
Flying probe testing is a quicker and more cost-effective method of testing when there are only a few circuits to test. It can also be used to test prototypes before the board goes into full production. The main advantage of the test is that it can be completed quickly and made available...
3 Blunt Probe Testing Equipment Related Categories Lab Furniture Other Analysis Instruments Lab Utensil and Disposable Hot Searches Testing Machine Testing Equipment Function Testing Testing Machinery Battery Test Probe Finger Test Probe Lab Test Probe Test Pin Probe Test P...
Testing & Verification 296 Customized Solutions Environmental Policy All solid and chemical waste are recycled by waste disposal company. All materials satisfy the standards of RoHS and REACH. Social Responsibility No child under 16 year old is employed. ...
range of engineering probe systems addressing the specific requirements of various market segments and applications such asDevice Characterization for modeling,Failure Analysis,Design Verification, IC engineering,Wafer Level Reliabilityas well special requirements for MEMS,High Power,RF and mmW devicetesting....
Usage for Accessibility Probe Testing MOQ 1 PC Delivery in 20-25 Days Standard IEC61032 Figure 11 Transport Package in Aluminum Box Specification IEC61032 Test probe17 Trademark ZLTJC Origin Guangzhou, China HS Code 9031809090 Production Capacity Stock Available ...