A test probe system for non-destructively interconnecting a high speed tester with the native conductive pad array of an integrated circuit device is disclosed. The system comprises a multilayer space transformer (12) including a power plane (46), a ground plane (48), a signal wiring plane (...
GOEPEL electronic extends the integration of Embedded JTAG Solutions to SPEA 4050 Flying Probe Systems. This enables the combination of the Boundary Scan test technology with the Flying Probe test. That makes the SPEA 4050 system a cost and time efficient test platform for electrical assemblies in ...
The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete ...
产品名称:flying probe test system/ inline header 产品型号:Condor MTS 505 产品厂商:digitaltest 产品文档: 简单介绍 flying probe test system/ inline header Condor MTS 505/flying probe The Condor can combine different test methods and can therefore be used universally for all test strategies. • 4...
MEMS Test Signal Integrity MPI TS200-SE Probe System TS200-SE 200mm ShieldEnviroment™ for EMI/RFI/light-tight shielding and ultra-low noise probing MPI TS200-IFE - 200 mm Manual Probe System with IceFreeEnvironment™ The MPI TS200-ShielDEnvironment™ (TS200-SE) is designed to ensure...
HOME NEWS SCANFIL CHOOSES SEICA’S PILOT V8 FLYING PROBE TEST SYSTEM 10Mar By admin 1167 The selected Seica flying probe machine is a testing device which is described as “perfect” for Scanfil’s high mix – low volume production environment. Read More here News Events Press Video press...
The SUMMIT200 probe station supports Contact Intelligence™ – a unique technology which enables autonomous semiconductor test. A powerful combination of innovative system design and state of the art image processing provides an operator-independent solution to achieve highly-reliable measurement data at ...
of the PILOTNEXT>SERIES offers the possibilityto execute parallel testing of twosingle or double-side boards. Thiscapability has a significant impacton test throughput, doubling it inthe first case, and in the secondcase, achieving a significantincrease, as well as the ROI of thetest system. ...
Those that are considering the purchase of a flying probe test system today must make strategically important and often not obvious choicesconcerning the system architecture strictly depending on the test requirements of the customer himself. To choose the most suitable architecture, it is important to...
网络移动探针测试 网络释义 1. 移动探针测试 ...针床(bed of nails)通断测试;另一种是移动探针测试(flying probe test system),也就是通常所说的飞针测试. d.wanfangdata.com.cn|基于22个网页