POST PACKAGE REPAIR (PPR) DATA IN NON-VOLATILE MEM
A post package repair (PPR) method is disclosed. The PPR method includes the following operations: receiving a first PPR signal and a second PPR signal, in which the first PPR signal corresponds to a first PPR mode, and the second PPR signal corresponds to a second PPR mode; generating a...
Example implementations relate to post package repair (PPR) data in non- volatile memory. In example implementations, PPR data may be stored in non-volatile memory on a memory module. PPR data may indicate how many of the plurality of repair units are available for performing post package repai...
Post Package Repair Failure for [PhysicalMemoryElementName] on Subsystem [MemoryElementName]. This message is for the use case when an implementation has detected that Memory double chip sparing has been initiated. Severity Info Alert Category ...
DIMM [arg1] Self-healing, attempt post package repair (PPR) failed with out of resource. [arg2] Parameters [arg1]DIMM Silk Label, 1-based [arg2]DIMM info (S/N, FRU and UDI.), e.g. "739E68ED-VC10 FRU 0123456" Severity Warning ...
A storage element can store information responsive to a post-package repair mode being activated. The information can identify an address mapped to a portion of the memory cells to be repaired. The storage element can store the information responsive to data received from nodes of the package. ...
- ANTIFUSE CIRCUITRY FOR POST-PACKAGE DRAM REPAIR PURPOSE: Anti-fuse circuit for a post-package DRAM repairing is provided to enhance a reliability and a function of synchronous DRAM, and enhances a produc... PJ Kim,YH Sul,JG Oh,... 被引量: 0发表: 2000年 Configurable Soft Post-Package ...
Marc Greenberg describes the post-package repair capability introduced in the LPDDR4 specification which is expected to increase in importance for future LP/DDR5 memories. Postedon Wednesday Jul. 26, 2017 Cadence ChannelCadence PCIe 4.0 Receiver JTOL Test ...
PROBLEM TO BE SOLVED: To repair package failures of multiple kinds for improved yield of high-density DRAM by allowing a programmable anti-fuse circuit to include a program address generating circuit, internal power-source generating circuit, and multiple anti-fuse unit circuits. ;SOLUTION: Each an...
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