Speckle metrology harnesses the interferometric properties of disordered light to achieve remarkable sensitivities. Often relying on time-domain analysis, it is rate-limited by the acquisition of speckle images. In the present work instead, we use a frequency-domain approach which spans 8 to 10 ...
where 𝑘k is the wave number; 𝑆(𝑘)Sk is the source power spectral density; 𝑅𝑟Rr is the reference arm reflectivity; 𝑅𝑠Rs is the reflectivity of the sample surface; 𝜌ρ is the detector responsivity; 𝑒e is the electric charge; 𝑛n is the refractive index; 𝑁𝑟...