We present a thorough analysis of physics-based hot-carrier degradation (HCD) models. We discuss the main features of HCD such as its strong localization at the drain side of the device, the weakening of the degradation at higher temperatures, and the change of the worst-case condition in ...
S. Tyaginov, Physics-based modeling of hot-carrier degradation, in Hot Carrier Degradation in Semiconductor Devices, ed. by T. Grasser. (Springer, Cham, 2014)S. Tyaginov, Physics-based modeling of hot-carrier degradation, in Hot Carrier Degradation in Semiconductor Devices , this volume, ed....
We present a thorough analysis of physics-based hot-carrier degradation (HCD) models. We discuss the main features of HCD such as its strong localization at the drain side of the device, the weakening of the degradation at higher temperatures, and the change of the worst-case condition in sm...
In this section, a PEMFC stack comprising several validated PEMFC models is applied in a test case for both electricity generation and domestic hot water preparation. Fig. 11 shows the implementation of a PEMFC-based Combined Heat and Power (CHP) system. The system comprises a PEMFC stack, a...
Optical-fibre links allow the most precise optical clocks to be compared, without degradation, over intracontinental distances up to thousands of kilometres, but intercontinental comparisons remain limited by the performance of satellite transfer techniques. Here we show that very long baseline ...
The Influence of Environment Temperature on the Degradation of Lead Zirconate Titanate Ceramic Fei Huang, De-Yi Zheng, Shun-Min Hu, Gui-Gui Peng Lead zirconate titanate (PZT) ceramic, as a kind of piezoelectric material, is widely used in the field of electronic industry because of its excelle...
摘要:Current understanding of the bias temperature instability degradation usually comprises two parts: (1) shallow-level component that can recover within a short time and (2) deep level traps that the emission time of the trapped carrier is extremely long. Prevenient studies of the positive bias...
15.3.1 Degradation due to the bond-breaking process 15.3.1.1 Single particle process 15.3.1.2 Multiple particle process 15.4 Conclusion References 16 TCAD simulation of emerging nanoscale devices 16.1 Introduction to Technology Computer-Aided Design (TCAD) for device modeling and simulation 16.1.1 About...
(e.g. serum amyloid protein) are often present in the deposits protecting them against degradation [9, 10, 11]. Similar deposits to those in the amyloidoses are, however, found intracellularly in other diseases; these can be localised either in the cytoplasm, in the form of specialised ...
A. Matulionis, GaN-based two-dimensional channels: hot-electron fluctuations and dissipation. J. Phys. Condens. Matter21, 174203 (2009) ADSGoogle Scholar S. Arulkumaran, G.I. Ng, C.M. Manoj Kumar, K. Ranjan, K.L. Teo, O.F. Shoron, S. Rajan, S. Bin Dolmanan, S. Tripathy, ...