关键词:加速寿命试验温度斜坡法失效激活能 ACCELERATED LIFE TEST FOR RAPIDIjY CONFIRMING ACTI、硝LTION ENERGY 0F MICROELECTRONIC DEVICE College ofElectronic Information and ConⅡol Engineering,Beijing University ofTechnology Beijing,100022,China Abstract:A new method Temperature Ramp method for rapid evaluati...