Accurate TDDB Lifetime Prediction of High-k Stacked Gate Dielectrics with Regarding High Density Initial Traps Kenji Okada 1 , Hiroyuki Ota 2 , Toshihide Nabatame 1 , and Akira Toriumi 2,3 MIRAI-ASET 1 , MIRAI-ASRC, AIST 2 , The Univ. of Tokyo 3 AIST Tsukuba West SCR Building (22300)...
Although, as noted, attitudes to e-authentication were broadly positive, there were some differences by age, supporting the earlier findings by Harmon and Lambrinos (2008), Underwood and Szabo (2003) and Okada et al. (2015). In particular, while older participants, who typically had limited ex...