AEC-Q100文件,是芯片开展车规等级验证的重要标准和指导文件。 B组验证是ACCELERATED LIFETIME SIMULATION TESTS 加速生命周期模拟验证 本文将重点对B组的第3项EDR - NVM Endurance, Data Retention, and Operational Life非易失性存储耐久性、数据保持性、工作寿命验证项目,进行展开讨论。 这个验证名字太长了。。。首...
AEC-Q100文件,是芯片开展车规等级验证的重要标准和指导文件。 B组验证是ACCELERATED LIFETIME SIMULATION TESTS 加速生命周期模拟验证 本文将重点对B组的第3项EDR - NVM Endurance, Data Retention, and Operational Life非易失性存储耐久性、数据保持性、工作寿命验证项目,进行展开讨论。 这个验证名字太长了。。。首...
Synopsys MTP EEPROM NVM IP Datasheet Highlights Products Downloads and Documentation Zero mask adder, single poly, floating gate, reprogrammable NVM solution 128-bit up to 8-Kbit configurations Up to 400,000 write cycle endurance Up to 10-year data retention at 125°C Integrated error checking ...
Zero mask adder, single poly, floating gate, logic-only reprogrammable NVM solution 128-bit to 16K-bit configurations Minimum of 100,000 write cycle endurance Minimum 10-year data retention at 85°C 50% area reduction over existing solutions ...
If I understand, you are asking whether the retention of records that are static (written only once) can be extended beyond 5 years without rewriting them in FlexRAM. As you can see, if the endurance is less than 10%, the retention of the data is guaranteed for 20 years.If the enduran...
CMOS compatible NVM is finding increasing applications that range from a few bits in analog trim applications to kilobits for data or code. CMOS compatibility comes with unique retention and endurance challenges. The floating gate is in direct contact with backend dielectric, which degrades high ...
The overall targeted performance for this new NVM are: 10usec of program time, 10K cycles of endurance and over 10 years of retention. Since the NSCore NVM solution does not require any additional processing steps in the standard logic process, it will be a low cost NVM IP solution. Also...
endurance and retention behavior of tunnel oxide can be done by leveraging existing Si material in CMOS compatible fabrication process. This approach yielded cost effectiveness in fabrication. The concern of this approach is that meticulous and precise control in optimal nitridation scheme is required ...
Editor's comments:- the new RAID is just one of many gems in this research paper. Others being the discovery that remanence in 3D nand includes a significant short term charge loss (in the first few minutes after writes), and also that an endurance based characterization of a small part ...
01_Yole_EmergingNVMEnterNicheMemoryMarkets