SURFACE AND INTERFACE ANALYSIS, VOL. 19, 241-246 (1992) The NIST X-ray Photoelectron Spectroscopy Database J. R. Rumble Jr, D. M. Bickham and C. J. Powell National Institute of Standards and Technology, Gaithersburg, MD 20899, USA The National Institute of Standards and Technology (NIST)...
比较常用的数据库为:NIST X-ray Photoelectron Spectroscopy Database,它是由美国国家标准与技术研究院(NIST)材料测量实验室 (MML)发布的XPS数据信息。 地址是:https://srdata.nist.gov/xps/Default.aspx(其使用方法,参见以往推文) 这里再推荐两个数据库。 图片 01http://www.xpsfitting.com/2012/01/common-o-...
Development of the web-based NIST X-ray Photoelectron Spectroscopy (XPS) Database The first Web-based version of the NIST X-ray Photoelectron Spectroscopy Database (XPSDB) is described. The current database, built from a relational datab... AY Lee,DM Blakeslee,CJ Powell,... - 《Data ...
元素查询 1.打开百度或者其他浏览器,输入网址(https://srdata.nist.gov/) 图一 2. 点击图一中的红色框(XPS-NIST X-Ray Photoelectron Spectroscopy Database),进入图二的界面。 图二 3. 点击图二中左边的红色框(Search Menu),出现右边的界...
XPS 能谱电子结合能查询的网址:http://srdata.nist.gov/xps/ [Last edited by hailang_zj on 2006...
X-ray chemical analysisX-ray photoelectron spectra/ NIST data resourcessurface analysisX-ray photoelectron spectroscopyAuger electron spectroscopyXPS databaseelectron elastic scattering cross-section databaseA description is given of data resources that are available from the National Institute of Standards ...
NIST X-ray Photoelectron Spectroscopy Database (Web, free access)X-Ray Transition Energies Database...
可溶性数据库(IUPAC-NIST Solubility Database), 溶解动力学数据库(NDRL/NIST Solution Kinetics Database on the Web), 坎德拉X-射线天文台光谱数据库(Spectral Data for the Chandra X-ray Observatory), 统计参考数据库(Statistical Reference Datasets), ...
A new database containing crystallographic and chemical information designed especially for application to electron diffraction search/match and related problems has been developed. The new database was derived from two well-established x-ray diffraction databases, the JCPDS Powder Diffraction File and NBS...
NIST Standard Reference Database 20 version 4.1 来自 ResearchGate 喜欢 0 阅读量: 393 作者:CD Wagner,AV Naumkin,A Kraut-Vass,JW Allison,JJR Rumble 摘要: An overview is given of improvements in the reliability of X-ray photoelectron spectroscopy (XPS) measurements over the past three decades. ...