An ATPG tool oriented to detect GOS defects with I/sub DDQ/ testing is presented. ATPG experiments on a set of benchmark circuits show the efficiency of the proposed tool.IsernE.RocaM.VLSI Test Symposium, 1999. Proceedings. 17th IEEE
机译:适用于智能无线系统的低功耗混合模拟数字电路设计技术。 8. Contribution to the Development of Smart Design Techniques for VLSI (Very Large Scale Integration) Integrated Circuits [R] . Sicard, E. 1987 机译:对VLsI(超大规模集成)集成电路智能设计技术发展的贡献 AI...
An example discussing some of these issues is http://dx.doi.org/10.1109/VLSIC.2012.6243846. ; It appears that the lead author now works for Intel research. Translate 0 Kudos Copy link Reply TaylorIoTKidd New Contributor I 10-29-2014 01:39 PM 3,238 Views Re: energy consumption...
For testing at the software level, unit and integration testing is the general approach. It scopes any software used in the lifecycle of the model (P07). It enables the verification of whether the techniques adopted in the design of the Machine Learning system are working as expected. However...
An example discussing some of these issues is http://dx.doi.org/10.1109/VLSIC.2012.6243846. ; It appears that the lead author now works for Intel research. 翻譯 0 積分 複製連結 回覆 TaylorIoTKidd 新貢獻者 I 10-29-2014 01:39 PM 3,108 檢視 Re:...
An example discussing some of these issues is http://dx.doi.org/10.1109/VLSIC.2012.6243846. ; It appears that the lead author now works for Intel research. Translate 0 Kudos Copy link Reply TaylorIoTKidd New Contributor I 10-29-2014 01:39 PM 3,176 Views Re: energy con...
An example discussing some of these issues is http://dx.doi.org/10.1109/VLSIC.2012.6243846. ; It appears that the lead author now works for Intel research. 翻译 0 项奖励 复制链接 回复 TaylorIoTKidd 新分销商 I 10-29-2014 01:39 PM 3,148 次查看 Re...
An example discussing some of these issues is http://dx.doi.org/10.1109/VLSIC.2012.6243846. ; It appears that the lead author now works for Intel research. Traducir 0 kudos Copiar enlace Responder TaylorIoTKidd Nuevo Colaborador I 10-29-2014 01:39 PM 3.079 V...