Fleischer M (2012) Near-field scanning optical microscopy nanoprobes. Nanotechnology Reviews 1. : 10.1515/ntrev-2012-0027 .Fleischer, M. Near-Field Scanning Optical Microscopy Nanop- robes. Nanotechnol. Rev. 2012, 1, 313-338.
近場光學顯微鏡 near-field scanning optical microscopy (NSOM), 工作方式: 近場光學的基本原理,即是在遠小於光波長的距離下,作光學的量測與觀察,以避免在遠場,也就是量測距離大於光波長時,由於光的波動性質引起的繞射現象所造成的繞射極限的限制。 近場光學顯微鏡的工作方式主要可分為兩種:穿透式與反射式。
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GaAs microtip for scanning near field optical microscopy(SNOM)sensors are integrated onto vertical-cavity surface emitting lasers(VCSELs)by agglutination. 介绍了应用于扫描近场光学显微术(SNOM)传感头的GaAs微探尖与垂直腔表面发射激光器(VCSEL)的粘合集成方法,并利用扫描电子显微镜对集成后的微探尖与VCSEL进...
4) Scanning near field optical microscope 扫描近场光学显微镜 1. This kind of scanner has been used in the system of scanning near field optical microscope. 这种扫描器被用于扫描近场光学显微镜探测系统中。 更多例句>> 5) scanning near-field optical microscopy ...
Near-Field Scanning Optical Microscopy (NSOM)Near-Field Scanning Optical Near-Field Scanning Optical Microscopy (NSOM)-high resolution microscopy -all about the tip -100 nm aperture created by e–beam -multiple modes of analysis -image and spectrum -spectral imaging ...
中文:扫描近场光学显微镜;英文:scanning nearfield optical microscope / SNOM的原理;中文:扫描近场光学显微镜;英文:scanning nearfield optical microscope / SNOM的定义;中文:扫描近场光学显微镜;英文:scanning nearfield optical microscope / SNOM是什么。利
Scanning near-field optical microscopy (SNOM) is a method for imaging at high resolution beyond the diffraction limit. Focusing the excitation light through an aperture with a diameter smaller than the excitation wavelength results in an evanescent field
Xiao M. On near- field scanning optical microscopy: Homogeneous and evanescent radiation. J . Mod. Opt . , 1997, 44( 2) : 327~ 344Xiao M. On near-field scanning optical microscopy:Homogeneous and evanescent radiation[J].Journal of Modern Optics,1997,(02):327-344.doi:10.1080/...
Superresolution optical images have been generated with near-field scanning optical microscopy (NSOM). The underlying concept is presented and several modes of operation are discussed. A resolution based on edge sharpness of 70 nm or better has been demonstrated with two different instruments. Images...