All those signals ran in 50-pin 0.5mm pitch flat-flex cables, with every other line as ground for modest level of shielding and impedance control. Never saw any problems with I2C or parallel bus either. Logged VK3DRB Super Contributor ...
Sample troubleshooting assessment grading criteria Troubleshooting practice problems Questions: 47 through 56 DC/AC/Semiconductor/Opamp review problems Questions: 57 through 76 General concept practice and challenge problems Questions: 77 through the end of the worksheet 1 ELTR 145 (Digital 2), section ...
Common problems faced by designers of these systems include • Large delays caused by capacitive loading of the bus • Noise due to simultaneous switching of the address and data bus signals Figure 25 shows an array of memory banks in which each address and data signal is loaded by the ...
Common problems faced by designers of these systems include • Large delays caused by capacitive loading of the bus • Noise due to simultaneous switching of the address and data bus signals Figure 25 shows an array of memory banks in which each address and data signal is loaded by the ...
again shown with separate color paths for clarity in FIG. 2, but coaxial in practice. Among problems with the conventional approach shown in FIG. 2 are relatively large angles of incidence for light from solid-state light sources14r,14g, and14b. Light from light source14ris incident on one...
However, once the transition is initiated, it is important to restore these buffers to normal occupancy levels as quickly as possible in order to avoid later latency problems (e.g., skips, discontinuities, pauses, etc.). If they are not restored, multiplexing efficiency will be reduced and ...
For odd values of reference voltage, the reference could be replaced by a resistor, but due to loading and temperature problems, these resistors should be buffered to the REF(+) and REF(−) inputs, Figure 6. The power supply must be well bypassed as supply glitches would otherwise be ...
At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.3 Trademarks E2E is a trademark...
6 avoids hold violation problems as explained above. Further, the output NAND gate 236 causes the scan chain to consume less power than would otherwise be the case. FIG. 7 shows an embodiment of a transparent negative level latch 250 that is scannable, observable and controllable. A negative...
At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.4 Trademarks E2E is a trademark...