type. Furthermore, the XRD pattern of 12 nm Mo after selenization with NaF precursor has the strongest diffraction peak at 2 =13.5° and the weakest diffraction peak at 2 =40.12° in these samples, which suggests that more Mo changes to MoSe ...
The XRD pattern showed that a phase-pure product was prepared. TEM analysis showed that the product was polycrystalline and had plate-shaped particles with a diameter of about 40 nm. The conversion process from MoO 3 to MoSe 2 is discussed....
Moreover, the crystal struc- ture of M-2 after the photocatalytic reaction was characterized by XRD and XPS (Figures S3 and S4). It can be observed from the XRD pattern that the crystal structure of M-2 does not show an obvious change before and after the photocatalytic reaction. The ...
TEM Analysis Fig. 2 XRD pattern of M oSe2 and W Se2 nanosheet peaks at 13.45° and 13.55°, respectively, confirms the 2H phase. The morphology and internal structure of M oSe2 and W Se2 NSs were studied by TEM. For TEM measurement, suspension of MoSe2 and...
(JCPDS:65-2023)9. It is worth noting that the Sv-ZIS sample shows almost the same XRD pattern with ZIS, indicating that the introduction of S vacancies can hardly affect the size and crystal structure of ZIS. Moreover, in the XRD patterns of Sv-ZIS/MoSe2, in addition to the peaks ...
Fig. 2(a) is the XRD diffraction pattern of Co3O4. An obvious diffraction peak appeared at a peak Conclusion In summary, this study used hydrothermal and physical mixing methods to prepare MoSe2@Co3O4 composites. Through XRD, XPS test proveing that the MoSe2@Co3O4 was successfully ...
The x-ray diffraction (XRD) pattern revealed that the synthesized NSs have a 2H phase with 0.65nm d-spacing which belongs to the (002) Miller plane. Transmission electron microscopy (TEM) studies revealed that M oSe2 and W Se2 have a nanosheet- like structure, and the average lateral ...
(ebn)tPaol wXdReDr XRD pattern pattern. Red aonfd(NgrHee3)nyNlina0e.5sMoSe2 refer to calculated patterns (Le Bail fitting) and background, respectively. Ticks refer to the peak positions tZp(hbrFee)C.da(itaccon)tmedSdciFc.hICcenomm(obarot)did,citenwrsaeoftpoerpsrehstshhaesoenewt(saN...
(a) XRD pattern of MoSe2 layers indicating the preferential growth in the (002) direction with intense (002), (004), (006), and (008) peaks, along with the presence of a weak (110) peak. (b) Raman spectra of MoSe2 with in-plane (E12g) and out- of-plane (A1g) vibration ...
[28,47]. In addition, the XRD pattern of the MoSe2 sample presents the presence of two peaks at 23.42◦ and 28.70◦, which correspond to the diffraction from (110) and (130) planes of MoO3 (JCPDS #05-0508). The presence of oxides can be due to various factors such as ...