XRD patterns of the samples calcined at 500°C indicated the formation of CoMoO4 for MoO330 mol% Co3O4, while those containing higher contents of Co3O4 (> 50 mol%) gave the typical XRD pattern of Co3O4. These results were confirmed by IR and TPR analyses. XPS analysis showed the ...
Here, we report a facile strategy for the synthesis of sulfur-doped molybdenum oxide nanorings with an atomic-level size (thickness of 0.5 nm) and a tunable ring-in-ring architecture. These atomic-level nanorings displayed strong photo-absorption in both the visible and infrared-light ranges...
The crystal structure of AlP-MoO2@Mo2C materials was verified by X-ray diffraction (XRD) pattern (Fig.2b). Both AlP-MoO2@Mo2C and MoO2@Mo2C samples exhibit characteristic diffraction peaks at 34.7°, 37.9°, 39.7°, 52.4°, 62.2°, 69.6°, 75.2°, and 76.1°, which can be indexed to...
The XRD pattern of the Mo-doped Nb2O5 samples (MN-0, MN-1, MN-3, and MN-5) presented in Figure 2a reveals a well-crystallized structure, as evidenced by the presence of intense diffraction peaks. These peaks are consistent with the Nb2O5 phase, with major diffractions observed at ...
The received XRD pattern can be indexed with standard diffraction peaks of Orthorhombic MoO3 (Space group: Pb nm) (JCPDF: 005-0508) [41]. All the diffraction peaks of g-C3N4 and Orthorhombic MoO3 were appeared in the XRD patterns of g-C3N4/MoO3 composite (c), authenticating the ...
The crystal structure of bulk MoS2 and MoS2 nanosheets is orderly and characterized by the X-ray diffraction (XRD) technique. Dhirendra et al. synthesized MoS2 nanosheets of various thicknesses in acetone solvent, and their crystal phases were confirmed by XRD pattern analyses (Fig. 1(b)). An...
(a) Raman spectra of (NH4)2WS4films annealed at different temperatures, (b) Raman spectra of (NH4)2WS4/(NH4)2MoS4(30 mM) film annealed at 500 °C, (c) XRD pattern of (NH4)2WS4film annealed at different temperatures, (d) XRD pattern of (NH4)2WS4/(NH4)2MoS4(30 mM)...
XRD pattern of the sample was tested by the D8 Discover X-ray diffractometer (Bruker, Germany) with Cu Kα radiation (λ=0.1541 nm) and distinguished according to the JCPD standards. FT-IR spectrometer (NEXUS, America) was employed to evaluate surface functional groups of MoS2 in the ...
XRD and Raman spectra. The results are shown in the Fig. S2. In Fig. S2a, theDandGpeaks of RGO are steeper, when the annealing temperature increases with an increasing value ofI(D)/I(G). It indicates that the degree for GO reduction is enhanced. From the XRD pattern (Figure S2b),...
Fig. 1. XRD pattern of Mo thin films grown at various DC powers. The average grain size or crystallite size is calculated from the broadening of the (1 1 0)cub peak using Scherrer equation:L=KλBcosθwhere K, L, λ, B, θ are the Scherrer constant, crystallite size, wavelength...