METHOD NUMBER TEST 1001 Barometric pressure 1022 Resistance to solvents 1026,1027 Steady-state life 1031,1032 High temperature life (nonoperating) 1038,1039,1040 Burn-in screen 1042 (Condition A,B, and C) Burn-n/life test for power MOSFETs 1051 (100 cycles or less) Thermal shock (temperature...
1.1 Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, th...
TEST METHOD NO. TITLE 1001.2 Barometric pressure (reduced) 1011.1 Immersion 1015.1 Steady–state primary photocurrent irradiation procedure (electron beam) 1016 Insulation resistance 1017.1 Neutron irradiation 1018.4 Internal gas analysis (IGA) 1019.5 Steady–state total dose irradiation procedure ...