Metrology And Measurement Systems创刊于1988年,由Polish Academy of Sciences, Committee on Metrology and Scientific Instrumentation出版商出版,收稿方向涵盖INSTRUMENTS & INSTRUMENTATION全领域,此期刊水平偏中等偏靠后,在所属细分领域中专业影响力一般,过审相对较易,如果您文章质量佳,选择此期刊,发表机率较高。平均审...
Metrology and Measurement Systems中文简介 计量和测量系统是国际期刊,同行评审,季刊出版,1988年发行;2001年起以英语出版。该期刊以纸质形式和电子形式出现在波兰科学院电子图书馆平台http://journals.pan.pl/dlibra/journal/116082上。 Metrology and Measurement Systems英文简介 Metrology and Measurement Systems is an...
Metrology and measurement systems are essential tools in many industries, including manufacturing, engineering, and science. They are used to measure various physical quantities such as length, mass, temperature, and pressure, among others. Metrology and measurement systems play a critical role in ensur...
Metrology and Measurement Systems《计量与测量系统》(季刊). Metrology and Measurement Systems is an international journal, peer-reviewed, quarterly-published, lau...[显示全部] 给编辑部投稿-->官网投稿 收藏本刊 报刊点评 咨询编辑部 纠错、补充
大类:Engineering小类:Control and Systems EngineeringQ3209 / 321 35% 大类:Engineering小类:InstrumentationQ3106 / 141 25% 名词解释: CiteScore:由Elsevier集团开发,类似影响因子用来评估杂志期刊学术影响力的一个指标。CiteScore采用了四年区间来计算每个期刊的学术引用。CiteScore拥有自带数据库Scopus,Scopus主要两个...
Metrology and Measurement Systems 期刊名缩写:METROL MEAS SYST期刊ISSN:0860-8229E-ISSN:2300-19412024年影响因子/JCR分区:1.0/Q4学科与分区:INSTRUMENTS & INSTRUMENTATION - SCIE(Q4)出版国家或地区:Poland出版周期:Quarterly出版年份:1988年文章数:48是否OA开放访问:Yes...
Metrology and Measurement Systems Metrology and Measurement Systems SCIE 计量和测量系统 ISSN:0860-8229 研究方向:工程技术 出版周期:Quarterly 是否OA:No ESSN:2300-1941 国际简称:METROL MEAS SYST 年发文量:60 出版地:Poland 官网:http://www.metrology.pg.gda.pl/ 较慢,6-12周审稿时间 4区中科院分区 ...
编辑部地址:POLISH ACAD SCIENCES COMMITTEE METROLOGY & RES EQUIPMENT, UL MIODOWA 10, WARSAW, POLAND, 00251 录用难度:容易 统计分析 影响因子:指该期刊近两年文献的平均被引用率,即该期刊前两年论文在评价当年每篇论文被引用的平均次数 Created with Highcharts 10.0.0年份Metrology and Measurement Systems近年影响...
Majkowski, Metrology and Measurement Systems, no. 3, 19, (2012), pp. 427-444L.B. Kish, R. Mingesz, Z. Gingl, C.G. Granqvist, Metrology and Measurement Systems 19, 653 (2012).L.B. Kish, Metrology and Measurement Sys...
基本信息 期刊全称 metrology and measurement systems 期刊简称 Print ISSN 0860-8229 Online ISSN 2300-1941 期刊出版社 是否开放获取 Open Access,OA 是 官网地址 期刊所属领域 期刊简介 JCR分区索引信息2021年数据 是否是SCIE(SCI) 注:SCI已经完全被SCIE取代,参考:SCI被取代 ...