A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray ...
The X-ray diffraction (XRD) patterns of the samples were mea-sured on an X’Pert PRO X-ray powder diffractometer with Cu-Kradiation ( = 1.5418 Å). Contacts of the Mn element in sample wereobtained by 2600T ICP-AES (Skyray Instrument, China). The realC/N/O composition evaluated fro...
X-Ray Diffraction Besides the use of X-ray absorption for the elucidation of adsorbates and adsorbate-surface interaction X-ray diffraction is a tool useful in particular for the determination of structural data on a very high level of precision provided the presence of a minimum level of ...
X-ray diffractionepitaxial systems.Basic equations relating to the anisotropic theory of elasticity for multilayer heterostructures are presented. These equations account for the plastic deformation and the layer lattice parameters mismatch with respect to the substrate. Special attention is given to take ...
X-ray diffraction methods in polymer science : Leroy E. Alexander, Wiley-Interscience, London-New York-Sydney-Toronto, 1969, pp. xv + 582, price 13.25Not Availabledoi:10.1016/0022-2860(71)87093-XA.D.R... DR A. - 《Journal of Molecular Structure》 被引量: 14发表: 1971年 X-ray diffra...
solid solutions/ A0785 X-ray, gamma-ray instruments and techniques A2930K X- and gamma-ray spectroscopy A8280D Electromagnetic radiation spectrometry (chemical analysis) B7450 X-ray and gamma-ray equipmentIn the 60 years since its discovery, X-ray diffraction has become established as one of ...
X-ray diffraction methods have been used to extract information on the microstructure of GaN and Quantum Dot structures. Various techniques and geometrical arrangements are combined with a new theoretical model and direct interpretation to obtain domain sizes in GaN and the asymmetry of quantum dots....
X-ray diffraction methods: polycrystallineaberrationsaccuracyanalytical extrapolation of latticeangle‐dispersive diffractometryBragg anglecamera methodsdetectiondiffractometryerrorsgeometrical aberrationsThe determination of lattice parameters using X-ray powder methods is reviewed. Topics covered include: wavelength ...
该综述以“Synchrotron-based X-ray absorption fine structures, X-ray diffraction, and X-ray microscopy techniques applied in the study of lithium secondary batteries” 为题发表在Small Methods上 (DOI: 10.1002/smtd.201700341),...
A. Larsson (now Nordxult ) investigated the anomalous dispersion of X-rays in 1928. The two-crystal spectrometer was introduced in 1927 by W. Ehrenberg and G. v. Susich . This led to an increased understanding of the importance of the diffraction of X-rays. The principles of bent ...