Rhode Schwarz, "Measurement of dielectric material properties," 2006.Measurement of dielectric material properties," Application Note, vol. RAC0 607-0019, pp. 1-35, 2006.Rohde & Schwarz, Measurement of dielectri
The dielectric properties of materials are defined, and the nature of their dependence on moisture content, frequency of the applied electric field, temperature of the material, and density of particulate materials is discussed. Dielectric properties of liquid water are summarized. The influence of ...
Schneider, et al., Dielectric properties of sewage biosolids: measurement and modeling, J. Microw. Power Electromagn. Energy 48 (3) (2014) 147-157.Brodie, G.; Destefani, R.; Schneider, P.A.; Airey, L.; Jacob, M.V. Dielectric Properties of Sewage Biosolids: Measurement and Modeling. ...
Dielectric constantPermittivityLoss tangentS-parametersMaterial measurementThis paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and ...
The measurement of dielectric properties of a material based on the reflection in an open-ended waveguide is a simple and nondestructive technique, which does not require extracting any sample of the material to be measured. It is therefore of interest for the study of moisture content in materi...
The dielectric tensor is a physical descriptor of fundamental light–matter interactions, characterizing anisotropic materials with principal refractive indices and optic axes. Despite its importance in scientific and industrial applications ranging from material science to soft matter physics, the direct meas...
Considering the dielectric properties of the raw material, it must be noticed that grape pomace presents a great variability due to the vintage and winemaking process, so a high accurate prediction is not feasible. Nonetheless, the argument proposed here can be applied to characterize any medium in...
Thin film material Refractive index Femtosecond time-resolving Introduction Usually, the optical properties of materials (matters) are light-wavelength dependent and associate closely with the dielectric constant (function) of the materials, ε=n+iηa in the linear approximation, where n and ηa desc...
1. A portable device for the measurement of a component content of a material using the dielectric properties of said material, said device comprising: a microwave source means for producing microwave radiation at an output; a directional coupler means, responsive to said microwave radiation, for ...
In addition to removing the excess copper, polisher 102 may also remove some dielectric material over lines 202a-202k, so that layer 225 in structure 200 becomes increasingly thin when going from street 201a towards a first conductive line 202a (FIGS. 3B and 3A), i.e. layer 225 has the...