Image transfer/audio and video testing (0xF0): Test Wi-Fi functionality and peephole camera connection. If you use the WBRU and WBRL module, this command is recommended. The MCU should send the testing command after the module finishes initialization (that is, after the MCU responds to the ...
Request body parsing from text/plain, application/json, application/x-www-form-urlencoded to msg.payload msg.req.headers, msg.req.query, and msg.req.params Accept file uploads Cookies Note: The full Node-RED listens on port 1880; the Node-RED MCU Edition, on port 80. A way to configure...
Key benefits are: Supports data rates up to 400 Mbit/s per trace line, 30 percent faster than competing trace products for Cortex-M-based embedded systems Utilizing Lauterbach’s full debug and trace functionality by TRACE32® PowerView software Saving ultra long-term test ...
Key benefits are: Supports data rates up to 400 Mbit/s per trace line, 30 percent faster than competing trace products for Cortex-M-based embedded systems Utilizing Lauterbach’s full debug and trace functionality by TRACE32® PowerView software Saving ultra long...
The VREFINT voltage is individually precisely measured for each part by ST during production test and stored in the part's engineering bytes. It is accessible in read-only mode. Calibration value name VREFINT Table 6. Internal voltage reference calibration values Description Raw data acquired at a...
The VREFINT voltage is individually precisely measured for each part by ST during production test and stored in the part's engineering bytes. It is accessible in read-only mode. Calibration value name VREFINT Table 6. Internal voltage reference calibration values Description Raw data acquired at a...
CTRL_Run_exe(&ctrlcla.Channel[i], cla_para.Period,cla_para.Test_flag); i=i+1; CTRL_Run_exe(&ctrlcla.Channel[i], cla_para.Period,cla_para.Test_flag); ctrlcla.TADC_Select=0; GpioDataRegs.GPBCLEAR.bit.GPIO33 = 1; } Susan Yang: ...
When changing to products of different part numbers, implement a system-evaluation test for each of the products. Notice 1. All information included in this document is current as of the date this document is issued. Such information, however, is subject to change without any prior notice. ...
(unless otherwise noted) PARAMETER TEST CONDITIONS Flash sector size Supported flash erase cycles before failure, full bank(1) (5) Supported flash erase cycles before failure, single sector(2) Maximum number of write operations per row before sector erase(3) Flash retention 105 °C Flash sector...
App Image: Application image with full path name. Eg: dslite.bat --mode processors -c COM55 -f C:\ti\j7_evm_repo\pdk\packages\ti\binary\udma_memcpy_testapp\bin\j721e_evm\udma_memcpy_testapp_mcu1_0_release.appimage -d 3 -o 100000 ...