离子源(ion source)是质谱仪主要的组成部件之一,其作用是使被分析的物质电离成为离子,并将离子会聚成有一定能量的离子束。常用的电离方法有电子轰击(Electron Impact, EI)、电喷雾电离(Electron Spray Ionization, ESI)、快原子轰击(Fast Atom Bombardment, FAB)、场致电离(Field Ionization, FI)、场致解吸(Field D...
质谱（mass spectrometry）：测量样品中离子的质荷比的技术。质荷比（m/z）：离子的质量与电荷的比值，是质谱分析的关键参数。进样系统（Sample Loading System）：用于将样品引入质谱仪的系统。离子源（Ion Source）：将样品分子转化为离子的装置。质量分析器（Mass Analyzer）：分离离子并根据其m/z进行...
解吸电喷雾电离 Desorption Electrospray Ionization,DESI 成像质谱 Mass Spectrometry Imaging, MSI 选择性离子富集Continuous Accumulation of Selected Ions, CASI 四极杆 Quadrupole,Q 滤质器 mass filter=四级杆 三重四级杆 QQQ 离子阱Ion trap 飞行时间 Time-of-flight, TOF 离子回旋共振Ion cyclotron resonance, IC...
An ion source for using in a mass spectrometry (MS) system is described. The ion source comprises an ion funnel comprising a first opening at a first end and a second opening at a second end, and the first opening is configured to receive neutral analyte molecules. Further described is an...
: A new ion source for mass spectrometry. J. Chem. Soc., Chem. Commun. 325-327.BARBER,M.; R. S. BORDOLI,G. J. ELLIOT. R. D. SEDGWICK& A. N. TYLER: Fast atom bombardment (FAB) : A new ion source for mass spectrometry. J. Chem. Soc., Chem. Commun. 1981: 325 - 327, ...
专利名称：ION SOURCES FOR MASS SPECTROMETRY 发明人：VESTAL, MARVIN,CAMPBELL,JENNIFER,HAYDEN, KEVIN 申请号：US2006004640 申请日：20060203 公开号：WO2006086585A3 公开日：20070705 专利内容由知识产权出版社提供 摘要：Provided are ion sources, methods of forming ions and mass analyzer systems. In various ...
ION SOURCES FOR MASS SPECTROMETRY 专利名称：ION SOURCES FOR MASS SPECTROMETRY 发明人：VESTAL, Marvin,CAMPBELL,Jennifer,HAYDEN, Kevin 申请号：US2006004640 申请日：20060203 公开号：WO06/086585P1 公开日：20060817 专利内容由知识产权出版社提供 摘要：Provided are ion sources, methods of forming ions and ...
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To provide a tandem mass spectrometer which can perform tandem mass spectrometry on a trace quantity of a sample to be analyzed with a system selecting ions to be analyzed or ions not to be analyzed together with the ions to be analyzed before a first stage mass spectrometry, even when a ...
spark source mass spectrometry火花源质谱法 secondary ion mass spectrometer (SIMS)二次离子质谱仪 multi ion mass spectrometer多离子质谱仪 ion cyclotron resonance mass spectrometer【化】 离子回旋共振质谱仪 相似单词 mass( )spectrometer质谱仪 spectrometern. 分光计 ...