The least squares fit for this linear model is to assign the sample mean to each site. The SOLUTION shows us the estimates for the parameters and the LSMEANS provides the least squares means. The default parameterization, the GLM parameterization, creates a dummy variable for each of the 5 ...
The fatigue of semiconductor devices is caused by the accumulation of thermal stress effects, so the current is in the form of RMS (Root-Mean-Square), and there is a square operation. In order to obtain μ, we propose a new AFT (BAFT) with bi-directional fatigue current. The BAFT test...