R&S®LCX LCR Meter는 다양한 용도를 지원하며 매우 정확하고 빠른 측정 성능을 제공합니다.
Agilent 4263B LCR Meter 操作手册说明书.pdf,Agilent4263BLCRMeter操作手册说明书用户手册产品说明书使用说明文档安装使用手册Agilent 4263B LCR Meter Operation Manual Manual Change Agilent Part No. N/A Jun 2009 Change 1 Add TAR in Test Signal Frequency Accuracy
With a data rate of up to 10 sample/s, the measured values are available every 100 ms. Measurement functions can be selected in pairs R&S®LCX-K106 advanced analysis functions In most cases, an LCR meter is used for measuring imped -ance values. However, depending on the type of compo...
Digital Precision High Frequency Electric Bridge Inductance Resistance Capacitance Tester LCR Meter Product Information Product Pictures Application: FAQ1. Are you a manufacturer or a trader?Yes, we are both. 2. What products do you have? We are focus on...
ideal for both desktop and handheld applications, making them a valuable addition to any electrical engineer's toolkit. **Versatile Application Scenarios** Whether you're a professional technician or a hobbyist, the Hantek Digital LCR Meter is designed to meet a wide range of measurement needs. ...
The EVAL-ADMX2001 LCR Meter Demo is an evaluation system that is comprised of both the ADMX2001B and the EVAL-ADMX2001EBZ boards. TheADMX2001Bis a high-performance, precision impedance analyzer module. Highly compact, 1.5 inch by 2.5 inch System-on-Module (SOM) ...
Monitor values Vac,Vdc :Voltage across the terminals of the sample. Iac, Idc :Current passing through the sample. Menu keys [BASIC] :Configures basic settings. [Rdc] :Configures DC resistance measurement settings. [ADVNC] :Configures application settings. [SYS] :Configures system settings. ...
2.13.5 Both Plotter and Laser Micrometer Together The cable connects from the back of the Series 900 Laser scanner box to the 25-pin connector labeled SERIAL. The other end of the cable, a 9 pin (DB9) connector, 12 • Getting Started Instrument and Windows Software LCR Series Operation ...
<div p-id="p-0001">An LCR meter to increase accuracy of balancing uses sub-balancing method, additional to analog balancing by trans-impedance amplifier (TIA). For this, the LCR meter, based on TIA, t
fluctuations occurring for instance on a single- or multiple-rotation substrate carrier can be additionally utilized for producing a nanostructure over part or all of the thickness of the layer, i.e. for lamination in the nano or micrometer range. Due to the process involved in that case, ...