电学模式和磁力显微的结合也很强大,如KPFM 和 MFM成像的不锈钢样品所示。开尔文探针力显微存在于CoreAFM和FlexAFM产品线中。
Kelvin Probe Force Microscopy (KPFM) enables high-resolution surface potential and topography mapping of a variety of samples.
Kelvin probe force microscopy in the presence of intrinsic local electric fields. Physica Status Solidi (a) 2011;208:777-89.Baumgart, C., et al., Kelvin probe force microscopy in the presence of intrinsic local electric fields. physica status solidi (a), 2011. 208(4): p. 777-789....
Kelvin probe force microscopy, or KPFM, was introduced as a tool to measure the local contact potential difference between a conducting atomic force microscopy (AFM) tip and the sample, thereby mapping the work function or surface potential of the sample with high spatial resolution. Since its fi...
Kelvin probe force microscopy(KPFM), also known assurface potential microscopy,is a noncontact variant of atomic force microscopy (AFM) that was invented in 1991. With KPFM, the work function of surfaces can be observed at atomic or molecular scales. The work function relates to many surface ph...
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures ...
网络探针力显微镜 网络释义 1. 探针力显微镜 1.2.4.2 Kelvin探针力显微镜(Kelvin Probe Force Microscopy)32-34 1.2.4.3 近场扫描光学显微镜(Near-field Scanning Optical Mi… cdmd.cnki.com.cn|基于2个网页
atomic force microscopy (AFM) dye-sensitized solar cells (DSC) Kelvin probe force microscopy (KPFM) surface photovoltage (SPV) titanium dioxide (TiO2) Introduction Dye-sensitized solar cells (DSCs) provide a promising low-cost, high-efficiency third-generation photovoltaic concept based on the spectra...
商品评价: 4.7 高 物流履约: 3.8 低 售后服务: 4.0 低 手机下单 进店逛逛|关注店铺 关注 企业购更优惠 海外直订Kelvin Probe Force Microscopy: Measuring and Compensating Electrostati 开尔文探针力显微镜:静电力的测量和补偿 Sadewasser,Sascha著 京东价 ...