JESD22-C101-C JEDEC STANDARD Field-Induced Charged-Device Model Test Method for ElectrostaticDischarge-Withstand Thresholds of Microelectronic Components JESD22-C101C (Revision of JESD22-C101B.01) DECEMBER 2004
JESD22-C101-C 下载积分: 100 内容提示: JEDEC STANDARD Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components JESD22-C101C (Revision of JESD22-C101B.01) DECEMBER 2004 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION ...
JEDECJESD22C101-C下载 JEDECJESD22C101-C 下载文件大小 662.89 Kbytes页 7 Pages 制造商 CREE [Cree, Inc]网页 http://www.cree.com/标志 功能描述 19 dB Typical Small Signal Gain at 4 GHz JEDECJESD22C101-C 数据表 (HTML) - Cree, Inc类似...
JESD22-C101D (Revision of JESD22-C101C, December 2004) OCTOBER 2008 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the...
JESD22-C101 概述 Richtek Technology Corporation JESD22-C101 数据手册 通过下载JESD22-C101数据手册来全面了解它。这个PDF文档包含了所有必要的细节,如产品概述、功能特性、引脚定义、引脚排列图等信息。 PDF下载 RT8120 Reliability Report For RT8120 Richtek Technology Corporation 5F, No. 20, Tai Yuen...
JESD22-A101-c(THB加速式温湿度及偏压测试) 热度: CDM手册-中英文对照版 热度: JEDEC STANDARD Field-InducedCharged-DeviceModel TestMethodforElectrostatic- Discharge-WithstandThresholdsof MicroelectronicComponents JESD22-C101F (RevisionofJESD22-C101E,December2009) ...
JESD22-A101-c(THB加速式温湿度及偏压测试) 热度: JESD22-B104-C 2004 Mechanical Shock 热度: 相关推荐 JEDEC STANDARD Field-InducedCharged-DeviceModel TestMethodforElectrostatic- Discharge-WithstandThresholdsof MicroelectronicComponents JESD22-C101C (RevisionofJESD22-C101B.01) DECEMBER2004 JEDECSOLIDSTATE...
JEDEC_CDM_JESD22-C101D
JESD22-C101E JEDEC STANDARD Field-Induced Charged-Device Model Test Method for ElectrostaticDischarge-Withstand Thresholds of Microelectronic Components JESD22-C101E (Revision of JESD22-C101D, October 2008) DECEMBER 2009 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications ...
JEDECSTANDARDField-InducedCharged-DeviceModelTestMethodforElectrostatic-Discharge-ponentsJESD22-C101C(RevisionofJESD22-)DECEMBER2004JEDECSOLIDSTATETECHNOLOGYASSOCIATIONNOTICEJEDECstandardsandpublicationscontainmaterialthathasbeenprepared,reviewed,,facili