JEDECSTANDARDElectricallyErasableProgrammableROMEEPROMProgram/EraseEnduranceandDataRetentionStressTestJESD-A117ERevisionofJESD-A117DAugust018NOVEMBER018JEDECSolidStateTechnologyAssociationDownloadedbywangshengws3640@163.comonMay8006:4amPDTbyd
本标准规定了基于资格规范进行有效的耐久性、保留性和跨温度测试的过程要求。电可擦除可编程只读存储器 (EEPROM) 程序 / 擦除 耐久性及数据保持应力测试, Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data