jedecqualificationsemiconductorfsastandardswafer JEDECPUBLICATIONFOUNDRYPROCESSQUALIFICATIONGUIDELINES(WaferFabricationManufacturingSites)JEP001A(RevisionofJP001.01,May2004)FEBRUARY2014JEDECSOLIDSTATETECHNOLOGYASSOCIATIONFABLESSSEMICONDUCTORASSOCIATIONNOTICEJEDECstandardsandpublicationscontainmaterialthathasbeenprepared,reviewed,andappro...
内容提示: JEDEC PUBLICATION FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites) JEP001A (Revision of JP001.01, May 2004) FEBRUARY 2014 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION FABLESS SEMICONDUCTOR ASSOCIATION Copyright Solid State Technology Association Provided by IHS under ...
JEDEC PUBLICATION FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites) JEP001A (Revision of JP001.01, May 2004) FEBRUARY 2014 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION FABLESS SEMICONDUCTOR ASSOCIATION Copyright Solid State Technology Association Provided by IHS under license with JEDE...
ENKRJPESRUDEjedec jep 001本专题涉及jedec jep 001的标准有7条。国际标准分类中,jedec jep 001涉及到。在中国标准分类中,jedec jep 001涉及到。未注明发布机构,关于jedec jep 001的标准JEDEC JEP 122H-2016 JEDEC JEP 122H-2016 JEDEC JEP164-2022 JEDEC JEP164-2022 JEDEC JEP185-2021 JEDEC JEP185-2021 ...
国际标准分类中,JEDEC涉及到半导体分立器件。 在中国标准分类中,JEDEC涉及到半导体分立器件综合。 未注明发布机构,关于JEDEC的标准 JEDEC JESD37A-2017JEDEC JESD37A-2017 JEDEC JESD246A-2020JEDEC JESD246A-2020 JEDEC JESD243A-2021JEDEC JESD243A-2021
This standard does not define which qualification method be followed (e.g., JESD47, JESD94, JP001, or JESD201), what tests must be performed, nor the qualification performance levels (e.g., reliability or quality) that a device must satisfy. Rather, it establishes a set of data elements...
JP- 001, Foundry Process Qualification Guidelines (Wafer Fabrication Manufacturing Sites). JESD22 Series, Reliability Test Methods for Packaged Devices JESD46, Guidelines for User Notification 21、 of Product/process Changes by Semiconductor Suppliers. JESD69, Information Requirements for the Qualification ...
JP-001, Foundry Process Qualification Guidelines (Wafer Fabrication Manufacturing Sites). JESD22 Series, Reliability Test Methods for Packaged Devices JESD46, Guidelines for User Notification of Product/process Changes by Semiconductor Suppliers. JESD69, Information Requirements for the Qualification of ...
JP ES RU DE 本专题涉及jedec 静电的标准有157条。 国际标准分类中,jedec 静电涉及到。 在中国标准分类中,jedec 静电涉及到敏感元器件及传感器、标准化、质量管理。 (美国)固态技术协会,隶属EIA,关于jedec 静电的标准 JEDEC JS-001-2010静电放电灵敏度测试人体模型(HBM) 组件级 [已取代:JEDEC JESD22-A114F、JE...