Barium Strontium Titanate (BST) is under consideration as a high dielectric constant material for a number of semiconductor applications. Because of its ve... T Remmel,M Schulberg,S Fujimura,... 被引量: 0发表: 0年 Determination of Z-profiles of diffraction data from profiles using a numerical...
Because of its ve... T Remmel,M Schulberg,S Fujimura,... 被引量: 0发表: 0年 Copyright (c)JCPDS-International Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 225 X-RAY ANALYSIS OF RESIDUAL STRESS DISTRIBUTIO... Barium Strontium Titanate (BST) is under ...