JCPDS-The International Centre For Diffraction Data (ICDD) Product Details 标准衍射卡片(PDF卡片)数据库是全球唯一经过ISO认证的晶体学数据库,主要用于结晶材料的物相鉴定,PDF数据库致力于为材料相关研究的用户解决难题,获得更准确的分析结果。PDF数据库涵盖40多个领域,是材料学、物理学、化学、地质学、药物学、生物...
晶型相同但晶格常数不相同,所以晶面间距不相同,根据布拉格方程就能得出不同的衍射角,以此区分晶型相同的物质。PDF2是ICDD (International Centre for Diffraction Data)的产品，ICDD的前身为JCPDS (Joint Committee on Poder Diffraction Standards) 。XRD（X射线衍射）是目前研究晶体结构(如原子或离子及其基团...
A task group of the JCPDS—International Centre for Diffraction Data (ICDD) was established for the purpose of investigating a methodology which would be applicable for statistical process control monitoring of X-ray powder diffractometers. A procedure for collecting X-ray diffraction data for statisti...
Copyright(c)JCPDS-International Centre for Diffraction Data Data 2001,Advances in X-ray in X-ray Analysis,Vol.44 381 An XRD Study of the Structure and Microstructure of the laboratory Synthesized Crystals of MgNb2O6 (MN) and PbMg1/3Nb2/3... Plate and Application to Three-dimensional Analy...
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 267 SYSTEMATIC ERRORS IN LINEAR PSD BASED HTXRD SYSTEMS 来自 core.ac.uk 喜欢 0 阅读量: 11 作者:EA Payzant,WS Harrison 摘要: We present an experimental determination of the effects of systematic...
= ⎛ ⎞ * ⎜∑ ⎟ + =-=(12)-=-, ⎝ ⎠ i 4Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 5 where IGlobal is a scale factor similar to the IPeak term in equation... TM Ely 被引量: 2发表: 1999年 EFFECT OF CALIBRATION...
huahua1216 只看到beta相的 *data for ICSD #30593 Coll Code 30593 Rec Date 1980/01/01...
Peak Data PeakList h k l d I 1 0 0 8.9500 7 0 0 1 ...
5.2.3 CCDC(Cambridge Crystallographic Data Centre,剑桥晶体数据中心)(英国) CCDC也被称为CSD (剑桥结构数据库)。主要用来查询有机晶体和金属有机晶体的标准卡片和CIF等信息。CCDC有网页版也有软件版。目前网上有较新的(2021)破解版本的CCDC软件可以下载。很多做MOF或者其他金属有机材料的在对合成的XRD进行物相分析...
Copyright (C) JCPDS-International Centre for Diffraction Data 1999 467 Residual Stress Gradients in a Tungsten Film by Grazing-Incidence XRD 来自 Citeseer 喜欢 0 阅读量: 15 作者:T Ely,PK Predecki,IC Noyan 摘要: Diffraction measurements were made on a 600 nm thick W film deposited on a ...