You are here:Home PRODUCTS ELLIPSOMETRY TUTORIAL SHORT COURSES REQUEST A QUOTE
Production:cleanroom equipment,coatings and thin films,optical testing equipment,ultrafast measurement systems,vacuum equipment Information of J.a. Woollam Co., Inc. j.a. woollam company offers a wide range of spectroscopic ellipsometers for nondestructive materials characterization. ...
J A Woollam Co , Inc 下载积分:600 内容提示: VASE®J.A. Woollam Co., Inc.Ellipsometry Solutions 文档格式:PDF | 页数:10 | 浏览次数:85 | 上传日期:2012-10-17 08:56:57 | 文档星级: VASE®J.A. Woollam Co., Inc.Ellipsometry Solutions ...
有使用J.A.Woollam CO.,Inc. 的M-44 椭偏仪的吗,有问题请教!!! straight-throgh calibration data 的曲线方向与说明书的正相反,是怎么回事? 说明书上是两个完整的波峰一个波谷,而校准的曲线是2个完整的波谷一个波峰回复此楼» 收录本帖的淘帖专辑推荐椭偏测量...
有使用J.A.Woollam CO.,Inc. 的M-44 椭偏仪的吗,有问题请教!!! straight-throgh calibration data 的曲线方向与说明书的正相反,是怎么回事? 说明书上是两个完整的波峰一个波谷,而校准的曲线是2个完整的波谷一个波峰 返回小木虫查看更多分享至: 更多 今日...
Merck & Co., Inc. 热度: Innovative性能 集25年的椭偏仪研制经验,J.A.Woollam公司发布了新一代的光谱型椭偏仪-RC2®。它既保留了以往椭偏仪的最佳性能,又结合了开创性的新技术,双旋转补偿器,消色差补偿器设计,先进的光源以及新一代的光谱仪设计。RC2既适用于各种光谱椭偏应用,又能够测量穆勒矩阵的所有参数。
distribute all or any part of it without written permission from the J. A. Woollam Co., Inc. J.A. Woollam Co., Inc. 645 M Street, Suite 102 Lincoln, NE, USA 68508 Phone: (402) 477-7501 FAX: (402) 477-8214 ©J. A. Woollam Co., Inc. Do not copy or distribute. Contents ...
Goeden, Christopher A. (Lincoln, NE, US) Application Number: 11/980262 Publication Date: 11/17/2009 Filing Date: 10/30/2007 Export Citation: Click for automatic bibliography generation Assignee: J. A. Woollam Co., Inc. (Lincoln, NE, US) ...
Bungay, C.L., Tiwald, T.E., DeVries, M.J., Dworak, B.J., and Woollam, J.A., In Situ and Ex Situ Ellipsometric Characterization of Oxygen Plasma and UV Radiation Effects on Spacecraft Materials, In Situ Process Diagnostics and Intelligent Materials Processing, 1998, pp. 177-183, 50...
J.A. Woollam Co., Inc. (Lincoln, NE, US) Primary Class: 356/369 International Classes: G01J4/00 Field of Search: 356/630, 356/369, 356/394 View Patent Images: Download PDF 7193709 US Patent References: 6605512Manufacturing method of a semiconductor device2003-08-12Kiyota438/296 ...