Therefore, this equation can be used to determine the mass of a scattering atom, M2, from its peak position in the spectrum or to predict the position of a peak for a given atom.Sometimes, E0 is unknown at the start of an experiment. The solution is to calibrate the energy using a ...
T.O. Metz, in Encyclopedia of Spectroscopy and Spectrometry (Third Edition), 2017 Ion mobility spectrometry coupled with mass spectrometry IMS is a rapid gas phase separation technique originally used in stand-alone devices for detecting explosives and chemical warfare agents. The IMS separation ...
This study is a further attempt to understand how experimental factors influence signal intensities and peak shapes in ion scattering spectroscopy (ISS). Different inert gases and mixtures have been scattered off polycrystalline Pt and Cu using primary beam energies ranging from 500 to 2000 eV. The...
Here we describe a detailed protocol for both data collection and interpretation with respect to ion mobility–mass spectrometry analysis of large protein assemblies. Ion mobility is a technique that can separate gaseous ions based on their size and shap
The sample thus ionized in the atmosphere by the plasma 48 is introduced to a mass filtering unit 60 and subjected to mass spectroscopy. Since a mass filter 62 is operated in a vacuum, however, an interface unit 50 is provided so as to extract the ionized sample efficiently into the vacuum...
, whereeandmeare the charge and the rest mass of the electron, respectively. Figure 2: 2D time-of-flight spectra of the MCP signals. The wavelengths of the laser beams were 228.5 nm (a) and 229.7 nm (b). The bottom sections are the vertical projections of the spectra with pulse...
IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profil
minimumdistance between trapaxis trapoperates peak-to-peakrf voltage 200Vat frequency MHz.Each electrode can inde-pendently dc biased allowing strayfields trappedions laser-cooling-assisted mass spectrometer (LAMS) [27,28]. Laser cooling bariumions wavelengthsnear 493 650nm. lasersenter separate fiber...
Fig. 2. (a) Schematic of DIBS, (b) X-ray photoelectron spectroscopy (XPS) spectra showing lattice, non-lattice oxygen ions and oxygen vacancies. (c) Forming of Pt/ZnO/Pt memory cell. (d) Forming-free memory cell Al/ZnO/Al. (e) Crystalline ZnO showing unipolar behavior. Reproduced from...
To elucidate this potential correlation, the concentration-depth profiles of the Ga ions are measured using secondary ion mass spectrometry (SIMS) for the two FIB-geometries. The SIMS results are shown in Fig. 6 together with the Ga and vacancy depth profiles calculated from Monte Carlo ...