ISVLSI：IEEE Computer Society Annual Symposium on VLSI，一看名称就知道只能算是集成电路里的非主流，...
The 2024 Symposium explores emerging trends and novel ideas and concepts covering a broad range of topics in the area of VLSI: from VLSI circuits, systems and design methods, to system level design issues, to bringing VLSI design to new areas and technologies such as nano- and molecular device...
会议日期: 2024-07-01 会议地点: Knoxville, Tennessee, USA 浏览:11275关注:2参加:2 征稿 The 2024 Symposium explores emerging trends and novel ideas and concepts covering a broad range of topics in the area of VLSI: from VLSI circuits, systems and design methods, to system level design issues,...
transistor and process levels. To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic...
IEEE Transaction on VLSI 附录:清华《数字集成电路与系统》教学大纲 在前期课程(集成电路基础I)基础上,以各 类数字电路模块设计方法为主线,讲授数字集成电路系统及其基本单元的分析设计方法,使同学初步具有从事数字集成电路分析和设计的能力,以及初步的数字集成电路设计经验。
The Symposium explores emerging trends and novel ideas and concepts covering a broad range of topics in the area of VLSI: from VLSI circuits, systems and design methods, to system level design and system-on-chip issues, to bringing VLSI methods to new areas and technologies like nano- and mo...
[ieee 1994 ieee symposium on vlsi circuits - honolulu, hi (june 9-11, 1994)] proceedings of 1994 ieee symposium on vlsi circuits - a 6-ns 4-mb cmos sram with offset-voltage-insensitive current sense amplifiers Not Available K Ishibashi,K Ueda,K Takasugi,... 被引量: 14发表: 1994年 ...
Lu, "Dynamic voltage scaling for multitasking real-time systems with uncertain execution time", Proceedings of the 16th ACM Great Lakes symposium on VLSI,... C Xian,YH Lu - IEEE 被引量: 163发表: 2006年 Optimum wire sizing of RLC interconnect with repeaters Friedman, Optimum wire sizing of ...
[ieee 2012 ieee symposium on vlsi technology - honolulu, hi, usa (2012.06.12-2012.06.14)] 2012 symposium on vlsi technology (vlsit) - ferroelectricity in hfo 2 enables nonvolatile data storage in 28 nm hkmg J Muller,E Yurchuk,T Schlosser,... 被引量: 2发表: 2012年 [ieee 2012 ieee ...
IEEE欧洲测试技术年会(The IEEE European Test Symposium)是欧洲集成电路和电路系统领域最重要的年度学术会议之一,重点展示和讨论集成电路和系统的测试、可靠性、安全性和验证领域的科学成果、前沿技术、研究热点和发展趋势。大会今年吸引了250余名来自世界各地的学者参加。