Built-in self test of CMOS-MEMS accelerometers BLANTON R D S.Built-in self test of CMOS-MEMS accelerometers. IEEE International Test Conference TC . 2002N. Deb, R.D. Blanton, "Built-In Self-... N Deb,R.D. Blanton - International Test Conference 被引量: 96发表: 2002年 [IEEE 2007 ...
SITISInternational Conference on Signal Image Technology & Internet Based Systems2023-09-172023-10-132023-11-08 cISA'International Conference on Information Security and Assurance2016-01-302016-02-152016-03-24 aa*a1MobiComInternational Conference on Mobile Computing and Networking2025-03-112025-05-102025...
International Conference on Computer Aided Design)、DATE(欧洲设计自动化与测试学术会议,Design, Automation and Test in Europe)、ASP-DAC(亚太地区设计自动化会议,Asia and South Pacific Design Automation Conference)一起被公认为电子设计自动化领域水平最高的四大国际会议。
Cape town, South Africa May 17-19, 2024 http://www.mimt.us/ Publication: Accepted papers will be published into ICMIMT Conference Proceedings by IEEE, included into IEEE Xplore, submitted for Ei Compendex and Scopus, same with the last few years. Call For Paper: Advanced Materials Engineering...
大会报告免费观看地址：2020 IEEE 9th International Power Electronics and Motion Control Conference-ECCE Asia (mudu.tv) 大会报告 2020年11月30日 08:30~18:00 本次国际会议特邀11位国内外电力电子与运动控制领域顶尖专家，对领域前沿方向、最新技术动态、产业应用最新热点进行精彩演讲，分享最新的研究成果。 Prof....
IEEE MTT-S International Conference on Microwaves for Intelligent Mobility 2024 event homepage Register Date Start date 2024-04-16 End date 2024-04-17 Meeting language Venue Boppard Description About the conference Intelligent mobility on road, in air, on sea or on rail is a trending ...
Full name: 2024 12th International Conference on Intelligent Computing and Wireless Optical Communications Short name: ICWOC 2024 Website:http://www.icwoc.org/ Time:June 21-23, 2024 Place: Chongqing, China *2024 12th International Conference on Intelligent Computing and Wireless Optical Communications ...
IoTDIIEEE International Conference on Internet-of-Things Design and Implementation2022-10-312023-01-202023-05-09 TSP'International Symposium on Trust, Security and Privacy for Emerging Applications2020-05-232020-07-232020-10-23 DIPECCInternational Conference on Digital Information Processing, E-Business ...
[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - On using address scrambling to implement defect tolerance in SRAMs RA Fonseca,L Dilillo,A Bosio,... 被引量: 0发表: 2011年 [IEEE 2011 IEEE Internationa...
IEEEC. Champlin, “IRIDIUM Satellite: A Large System Application of Design for Testability,” in Proc. of the International Test Conference , Oct. 1993,... C Champlin - IEEE 被引量: 32发表: 1993年 Thermal cycling test as a quality control and/or acceptance test for HV form-wound stator...