The Qualification and Reliability monitoring test conditions have typically duration of 1000 hours per condition B of Table 1 (JESD 47). Other conditions and durations may be used as appropriate. The devices may be returned to room ambient conditions for interim electrical measurements. 芯片在测试过...
The Qualification and Reliability monitoring test conditions have typically duration of 1000 hours per condition B of Table 1 (JESD 47). Other conditions and durations may be used as appropriate. The devices may be returned to room ambient conditions for interim electrical measurements. 芯片在测试过...
JEDEC_HTSL JEDEC STANDARD High Temperature Storage Life JESD22-A103-B (Revision of JESD22-A103-A)AUGUST 2001 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION