How to plot JCPDS card with the XRD data using OriginLab software 47 -- 31:20 App High-temperature X-ray diffraction - a powerful technique to analyze your sample 80 -- 15:17 App How to plot XRD data in origin -
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measuredex situby XRD. The XRD analysis of the 33-nm-thick SDC film on LAO reveals an average out-of-plane tensile strain of 0.37%. Comparing this value with the theoretical lattice mismatch of 0.49% between the two materials, we conclude that∼25% of the theoretical lattice mismatch is ...
In the last few years, the EIS method has become a very promising method for studying heterostructured photoactive materials with the aim of improving their perfor- mance by identifying the origin of the limitations of their energy conversion and stability. The number of publications devoted to the...