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This sampling strategy relies on an iterative process of sampling and analysing. It carries out an analysis after each interview conducted, identifies the gaps in knowledge, and chooses the subsequent expert to always fill the biggest current gap in knowledge. The interview process stops when ...
An XRD pattern of silicon wafer was used for instrumental error compensation and calibration of JADE 6.5®analysis software. For Ta = 450 ◦C the average crystallite size was around 21 nm, which slightly increases to 25 nm for 550 ◦C. Similar results have been reported in the ...